A Guide to Computed Tomography System Specifications

Abstract

The sensitivity to feature and anomaly detection in industrial X-ray computed tomography (CT) systems is a function of CT system operating parameters. Established as a part of the envelope that strikes a balance between sensitivity, inspection time and cost. These parameter choices eventually find their way into CT system attributes: configurations, components and procedures. CT system users are concerned with sensitivity requirements for specific instruction purposes, while CT system manufacturers are concerned with their implications for the system's physical constituents, assembly and control. This report discusses the attributes and the conversion to system constituents that must occur for a useful CT system specification to be prepared. The effect of attribute specification on CT system constituent costs are addressed. Understanding these issues is critical to the successful acquisition and implementation of a new CT system. Guidelines for the preparation and evaluation of CT specifications are provided.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1990
Accession Number
ADA229998

Entities

People

  • Paul Burstein
  • Richard H. Bossi

Organizations

  • Boeing

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Engineered Resilient Systems
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Computer Programming
  • Computer Programs
  • Computers
  • Control Panels
  • Control Systems
  • Detection
  • Detectors
  • Engineering
  • Gamma Rays
  • Geometry
  • Image Processing
  • Manufacturing
  • Materials
  • Procurement
  • X Rays
  • X-Ray Computed Tomography

Fields of Study

  • Physics

Readers

  • Medical Imaging.
  • Software Engineering
  • Theoretical Analysis.