Short Pulse Test Set

Abstract

This report discusses the construction and operation of the Short Pulse Test Set that has been built for the U.S. Army Missile Command for the purpose of applying short (25 to 100 nanosecond), high voltage pulses to EEDs in both the pin-to-pin and pins-to-case mode. The test set employs the short pulse generating techniques first described in the Franklin Institute Research Laboratories (now Franklin Research Center) Report I-C3410, 'Pins-to-Case Short Pulse Sensitivity Studies for the Atlas DC Switch', December 1974. This report, authored by Ramie H. Thompson, was prepared for Picatinny Arsenal under contract DAAA21-72C-0766. The test set described herein utilizes a computer controlled high speed digitizer to monitor the pulse voltage and current and provides software to process and display these data.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1990
Accession Number
ADA231119

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Analog To Digital Converters
  • Attenuators
  • Circuits
  • Connectors
  • Generators
  • High Voltage
  • Impedance
  • Measurement
  • Measuring Instruments
  • Power Supplies
  • Pulse Generators
  • Switches
  • Test Equipment
  • Test Sets
  • Transmission Lines
  • Voltage
  • Waveforms

Fields of Study

  • Physics

Readers

  • Business Analytics
  • Electrical Engineering
  • Military History