Scattering from Thin Apertures in Coated Conductors Using FDTD

Abstract

The Finite-Difference Time-Domain (FDTD) technique is applied to scattering problems involving thin dielectric sheets, conductor-backed dielectric sheets and conductor-backed dielectric sheets containing cracks in the dielectric coating. The FDTD technique is first applied in a 'brute force' method to solve the scattering problems. Then, coarse cells are used whereby the dimensions of the scatterer can be smaller than the dimensions of the FDTD unit cell. This approach, referred to as the 'thin equation' approach, is computationally more efficient than the 'brute force' method. Numerical results are shown in the frequency domain. Specifically, radar cross section (RCS) and near-field results obtained using a two-dimensional FDTD code are presented.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1990
Accession Number
ADA232125

Entities

People

  • Kenneth R. Demarest
  • Panayiotis A. Tirkas

Organizations

  • University of Kansas

Tags

DTIC Thesaurus Topics

  • Cartesian Coordinates
  • Computational Science
  • Dielectrics
  • Electric Fields
  • Electromagnetic Fields
  • Electromagnetic Radiation
  • Electromagnetic Scattering
  • Equations
  • Far Field
  • Finite Difference Time Domain
  • Frequency Domain
  • Geometry
  • Magnetic Fields
  • Near Field
  • Scattering
  • Three Dimensional
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Finite Element Method (FEM) for solving Partial Differential Equations (PDEs)
  • Thin Film Deposition Science.