X-Ray Diffraction and Electron Spectroscopy of Epitaxial Molecular C sub 60 Films
Abstract
Films of the new carbon allotrope, molecular C60, also known as Buckminsterfullerence, have been grown on Si(111) substrates by molecular beam epitaxy. The films have been characterized with x-ray two-theta diffraction, x- ray photoelectron spectroscopy, Auger electron spectroscopy, and electron energy loss spectroscopy. The diffraction data from oriented films show that close- packed planes of C60 molecules are stacked parallel to the substrate surface, but that the correlation length for x-ray scattering is less than 200 angstroms. The electron spectroscopic data shows that the C atoms of C60 are essentially sp2-bonded, but there are significant differences with respect to graphite.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 28, 1991
- Accession Number
- ADA232152
Entities
People
- Douglas A. Ohlberg
- F. D. Diederich
- Hong K. You
- Marcos M. Alvarez
- R. Stanley Williams
- R.L. Whetten
- Samir J. Anz
- William M. Tong
- Y. Rubin
Organizations
- University of California, Los Angeles