Surface X-Ray Scattering Measurements of the Substrate Induced Spatial Modulation of an Incommensurate Adsorbed Monolayer

Abstract

We report in-situ surface X-ray scattering measurements of electrochemically deposited TI monolayers on Ag(III). We find that the TI adlayer forms an incommensurate, two dimensional solid and we determine the spatial modulation in the TI monolayer that is induced by the periodic potential of the substrate. The modulation of the TI monolayer changes the intensity of the X-ray scattering from the Ag substrate (the Ag crystal truncation rods), since the modulation wavevectors are commensurate with the substrate periodicity. By measuring the intensity changes along the Ag truncation rods, we determined the first Fourier component of the longitudinal part of the substrate induced modulation to be 0.03 angstroms, and the spacing of the TI monolayer above the Ag surface to be 3.05 angstroms.

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Document Details

Document Type
Technical Report
Publication Date
Jan 29, 1991
Accession Number
ADA232625

Entities

People

  • Gary L. Borges
  • Joseph G. Cordon
  • Larry B. Sorensen
  • Mahesh G. Samant
  • Michael F. Toncy

Organizations

  • University of Puerto Rico

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Chemistry
  • Crystal Structure
  • Diffraction
  • Electrodeposition
  • Films
  • Materials
  • Materials Science
  • Military Research
  • New York
  • Scattering
  • Surface Roughness
  • Thin Films
  • Three Dimensional
  • Two Dimensional
  • United States
  • X Ray Scattering
  • X Rays

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Image Processing and Computer Vision.
  • Thin Film Deposition Science.

Technology Areas

  • Space