Qualification Procedures for VHSIC/VLSI

Abstract

This program developed, outlined, refined, and verified the test methodology and qualification criteria and procedures to be used to ensure the integrity and reliability of microcircuit devices designed for insertion into military systems. A major portion of the criteria and procedures, reflected herein, enables a significant reduction in time and cost of the microcircuit Quality/Reliability Assurance process by addressing up front simulations during design prior to commitment, complex and expensive manufacturing processes with in-line quality processes controlled by a SPC (Statistical Process Control) program and ongoing QA Program using their TRB (Technology Review Board) and SEC (Standard Evaluation Circuit) programs.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1990
Accession Number
ADA233110

Entities

People

  • Thomas A. Baumes

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Application-Specific Integrated Circuits
  • Assembly
  • Databases
  • Electronics Industry
  • Fabrication
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Manufacturing
  • Modules (Electronics)
  • Organizational Structure
  • Quality Control
  • Reliability
  • Semiconductor Manufacturing
  • Semiconductors
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Readers

  • Life Cycle Cost Analysis
  • Software Engineering

Technology Areas

  • Microelectronics