Transmission Electron Microscopy of the CVD Diamond Film/Substrate Interface.

Abstract

Progress has been made in understanding growth patterns of Thin Fine Grain Diamond CVD Films. In the study which was performed by High Resolution Electron Microscopy attention was focused on the fault structure as a function of the position in the grain as well as on the formation of mismatch boundaries within the growing diamond crystal. These boundaries are formed due to mismatch between certain twins within the growing crystal. It was found that these boundaries can serve as precise indicators for the local growth direction of the crystal and thus to lead back to the nucleation point in a given TEM cross section. In an example given in this report the local nucleation point is traced back to a 5-fold twin site.

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Document Details

Document Type
Technical Report
Publication Date
Mar 15, 1991
Accession Number
ADA234790

Entities

People

  • Dan Shechtman

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Air Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Chemical Vapor Deposition
  • Crystal Growth
  • Diameters
  • Diamond Films
  • Electron Microscopy
  • Engineering
  • Grain Size
  • High Resolution
  • Jet Propulsion
  • Materials
  • Materials Science
  • Mechanical Engineering
  • Microscopy
  • Military Research
  • Standards
  • United States
  • Universities

Fields of Study

  • Physics

Readers

  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene