Dosimetry for Microelectronics.

Abstract

Existing information on the dose enhancement effect is reviewed and current problems identified. Possible solutions are outlined. In addition, the design and use of a dual cavity ionization chamber for routine measurement of dose enhancement factors in cobalt-60 gamma test facilities is described. The enhancement factors can be derived directly from the chamber measurements without recourse to reference data that may be difficult to obtain. This relatively simple device reliably reproduced earlier results obtained by more involved equipment and procedures. Measured enhancement factors are reported for new material combinations not previously examined and compared with recent calculations.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1991
Accession Number
ADA235601

Entities

People

  • Edward A. Burke

Tags

Communities of Interest

  • Biomedical
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Alkanes
  • Dielectrics
  • Gamma Rays
  • Ionization
  • Ionization Chambers
  • Ionizing Radiation
  • Materials
  • Measurement
  • Microelectronics
  • Modules (Electronics)
  • Radiation
  • Radiation Effects
  • Semiconductor Devices
  • Semiconductors
  • Test Facilities
  • X Rays

Fields of Study

  • Medicine
  • Physics

Readers

  • Electronics Engineering
  • Instructional Design and Training Evaluation.
  • Plasma Physics.

Technology Areas

  • Microelectronics