Computer Assisted Instruction System Effectiveness on Troubleshooting Training

Abstract

The purpose of this study was to determine the performance effects of strategic troubleshooting computer assisted instruction (CAI) on troubleshooting behavior during performance tests on printed circuit boards. The study addressed whether or not supplementing the regular troubleshooting training curriculum with a CAI course would improve subsequent student performance over students who did not receive the additional instruction. Subjects in the research were 54 Navy recruits in Electronic Technician training at the Basic Electricity and Electronics school at Orlando Naval Training Center. Students were classified as high, medium or low proficiency based on completion time of the previous self- paced course modules. A two way analysis of variance design was used for the independent variables of treatment condition (troubleshooting CAI versus control CAI versus control) and three student proficiency levels. The control CAI group received a BASIC programming course similar in length and presentation to the troubleshooting CAI to account for any Hawthorne effects resulting from the CAI treatment. The dependent variables were number of test points probed, time to probe, and success rate on the first fault diagnosis. Additionally, the troubleshooting logic used by the students was extensively analyzed.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1983
Accession Number
ADA235815

Entities

People

  • Grace P. Waldrop
  • L. B. Mcdonald
  • V. T. White

Tags

Communities of Interest

  • Human Systems
  • Weapons Technologies

DTIC Thesaurus Topics

  • Analysis Of Variance
  • Circuit Boards
  • Computer Programming
  • Computers
  • Curriculum
  • Data Science
  • Education
  • Electronic Equipment
  • Electronics
  • Experimental Design
  • Instructions
  • Military Research
  • Naval Training
  • Performance Tests
  • Pilot Studies
  • Students
  • Training

Fields of Study

  • Education

Readers

  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • STEM Education
  • Systems Analysis and Design

Technology Areas

  • Microelectronics