The Structure of Ta3N5 at 16K by Time-of-Flight Neutron Diffraction

Abstract

Several authors have mapped out the phase diagram of the Ta-N system. Gamma Ta2N crystallizes with close-packed metal atoms; the nitrogen atoms fill the octahedral sites. Epsilon-TaN has the B35 structure-type which consists of very densely packed metal atoms; nitrogen atoms fill deformed octahedral holes. Ta4N5 and Ta5N6 can be prepared as thin films and have been analyzed by electron diffraction (Terao, 1971). At elevated temperatures, delta-TaNx forms with the rocksalt structure. Thin films are reported with the hexagonal WC structure.

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Document Details

Document Type
Technical Report
Publication Date
May 30, 1991
Accession Number
ADA236596

Entities

People

  • Francis Disalvo
  • Michael O’keeffe
  • Nathaniel Brese
  • Paul Rauch

Organizations

  • Cornell University Department of Chemistry and Chemical Biology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Chemistry
  • Classification
  • Detectors
  • Diffraction
  • Electron Diffraction
  • Films
  • Materials
  • Military Research
  • Neutron Diffraction
  • Neutron Scattering
  • Nitrogen Compounds
  • Phase Diagrams
  • Scattering
  • Security
  • Thin Films
  • Universities

Readers

  • Combustion science or combustion engineering.
  • Military Logistics and Supply Chain Management
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene