Diffraction Determination of the Structure of Metastable Three- Dimensional Crystals of Ge Grown on Si(001)
Abstract
A straightforward kinematic analysis of diffraction from metastable three-dimensional crystallites of Ge grown on Si(001) is presented. Low-energy electron diffraction data from these crystallites are shown to agree with diffraction images calculated for a structure determined from scanning-tunneling microscopy data. Additionally, reflection high-energy electron diffraction images predicted for these crystals agree with existing data.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 25, 1991
- Accession Number
- ADA236871
Entities
People
- C. E. Aumann
- M. G. Lagally
- Y. W. Mo
Organizations
- University of Wisconsin–Madison