Applications of Scanning Tunneling Microscopy to Electrochemistry
Abstract
The focus of research in the last year has been STM (Scanning Tunneling Microscopy) studies of electrode solution interfaces. STM, and its derivatives (e.g. AFM, Atomic Force Microscopy) are the only surface analytic methods capable of yielding real-space, atomic resolution, electronic and structural maps of immersed electrode surfaces. To achieve this goal, in the previous contract period we have developed STM tip preparation methodologies that enable atomic resolution imaging of electrode surfaces in solutions containing high (0.1 M) concentrations of electron donar and acceptor species. These techniques have significantly extended the applicability of STM to electrochemical investigations. Recent STM investigations of electrochemical systems surface under varied media.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 31, 1991
- Accession Number
- ADA237021
Entities
People
- Nathan S. Lewis
Organizations
- California Institute of Technology