Determining Stresses in Composites

Abstract

The basic diffraction techniques for the stress tensor analysis are reviewed, with particular emphasis on what can be done without knowing the unstressed lattice parameters(s). Examples are given of the residual stresses in thin films, how to measure the bonding and yield stress in composites and separating the micro and macrostresses to examine load sharing between phases. In this paper the term composite includes thin films on substrates, and steel, as well as other phase mixtures i.e. to include any arrangement where one phase has its properties affected by the presence of another.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1991
Accession Number
ADA238618

Entities

People

  • Jerome B. Cohen

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Bulk Materials
  • Composite Materials
  • Coordinate Systems
  • Diffraction
  • Engineering
  • Equations
  • Fabrication
  • Films
  • Geometry
  • Low Temperature
  • Materials
  • Materials Processing
  • Materials Science
  • Residual Stress
  • Thin Films
  • Universities

Readers

  • Materials Science and Engineering.
  • Structural Health Monitoring of Composite Structures.
  • Thin Film Deposition Science.