Electron-Beam-Pinch Experiment at Harry Diamond Laboratories: Providing for a High-Dose-Rate Flash X-Ray Facility for Transient Radiation Effects on Electronics (TREE) Testing of Pieceparts

Abstract

The peak photon-radiation dose rate of the High-Intensity Flash X-Ray facility has been increased by at least a factor of five through the use of custom beam-pinching hardware. With this hardware, the facility can now routinely provide a dose rate of 2.7 times 10 to the 11th power rads(Si)/s, at a distance of 1/4 in. from the drift-tube face, while providing excellent radial drop-off to minimized irradiation of items surrounding the device under test. The experimental results show the optimum operating parameters of the beam-pinching hardware to be a drift-tube length equal to 6 cm with an internal nitrogen gas pressure of 0.1 Torr.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1991
Accession Number
ADA239558

Entities

People

  • Dale N. Robertson
  • Gregory K. Ovrebo
  • James C. Blackburn
  • Marc S. Litz
  • Steven M. Blomquist

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Army
  • Circuit Boards
  • Dose Rate
  • Electromagnetic Pulses
  • Electron Beams
  • Electronics
  • Electrons
  • Ionizing Radiation
  • Magnetic Fields
  • Nitrogen
  • Printed Circuit Boards
  • Printed Circuits
  • Radiation
  • Radiation Effects
  • Semiconductor Devices
  • X Rays

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Software Engineering

Technology Areas

  • Directed Energy
  • Microelectronics