Diffraction Pattern Analysis as an Optical Inspection Technique
Abstract
A few examples are presented which illustrate the usefulness of optical inspection techniques. Diffraction patterns produced by defects are often distinctive and can be used to examine objects nondestructively. It was also found that if the defect is minor and occupies only a small fraction of the illumination area, the defect diffraction pattern cannot be distinguished from the bright background. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1991
- Accession Number
- ADA241724
Entities
People
- Don A . Gregory
- Helga A. Alexander
Organizations
- United States Army Aviation and Missile Command