An Automatically Calibrated Universal Measuring Equipment for Noise in Semi-Conductors

Abstract

Recent development in X and Gamma Ray spectrometry and Infra-red detection require the use of Junction Field-Effect Transistors (JFets) which exhibit very low levels of noise in the frequency range from a few Hertz to 100KHz. A micro-computer controlled equipment has been developed which can measure the noise of Fets, NPN and PNP bipolar transistors in the frequency range 10Hz to 100KHz, to a greater accuracy than that obtainable from available equipment. The device operating parameters may be varied under computer control, allowing noise measurements to be performed automatically over a range of conditions. When measuring four-terminal (or tetrode) Fets, the substrate voltage may be varied independently of the gate voltage.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1982
Accession Number
ADA241764

Entities

People

  • C. E. Cox

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Amplifiers
  • Bipolar Junction Transistors
  • Circuits
  • Computers
  • Dynamic Range
  • Electrical Resistance
  • Field Effect Transistors
  • Fixed Resistors
  • Frequency
  • Generators
  • Low Noise
  • Measurement
  • Resistors
  • Schematic Diagrams
  • Substrates
  • Transistors

Fields of Study

  • Physics

Readers

  • Acoustics.
  • Electronics Engineering
  • Integrated Circuit Design and Technology.