Scanned Probe Microscopies: STM and Beyond

Abstract

This conference dealt with an array of scanning probe and other microscopy techniques based on various physical and chemical properties. Some of them are: Scanning Tunneling Microscopy STM, Scanning Electrochemical Microscopy SEM, Scanning Capacitance Microscopy SCM, Scanning Force Microscopy SFM, Atomic Force Microscopy AFM, Magnetic Force Microscopy, Photon STM, Ballistic Electronic Microscopy, Photo Tunneling Microscopy, Evanescent Field Optical Microscopy.

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Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1991
Accession Number
ADA241949

Entities

People

  • Charles Stewart

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Biochemistry
  • Biology
  • Chemical Properties
  • Chemistry
  • Classification
  • Electron Microscopes
  • Electron Microscopy
  • Engineering
  • High Resolution
  • Magnetic Forces
  • Microscopes
  • Microscopy
  • New York
  • Quantum Tunneling
  • Security
  • Tunneling

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene