A PC Program to Calculate the One-Sided Lower Tolerance Limit for Total Ionizing Dose Radiation Data

Abstract

The radiation level of a semiconductor part type can be found to be just above the level needed for survivability. Many times the part has to be accepted or rejected lot to lot (lot qualification) on the basis of radiation data from small a sample of the lot. One-sided lower-tolerance -limit statistics is used on the radiation data to determine lot acceptance or rejection. An IBM- compatible PC program, written to calculate the one-sided lower tolerance limit at 90- to 50-percent confidence for log-normally distributed radiation data (the usual distribution for semiconductor radiation data), is described in this report. The analysis results can be displayed in tabular and graphical form on the PC screen and a hard copy made on the printer.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1991
Accession Number
ADA242365

Entities

People

  • Ahmed A. Abou-auf
  • Mark E. Bumbaugh

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Advanced Electronics
  • C4I
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • C Programming Language
  • Computer Programming
  • Computers
  • Data Science
  • Hard Copy
  • Hardness
  • Information Science
  • Language
  • Normal Distribution
  • Personal Computers
  • Radiation
  • Security
  • Semiconductors
  • Standards
  • Statistical Analysis
  • Statistics
  • Survival

Readers

  • Computer Science.
  • Nuclear and Radiation Engineering.
  • Regression Analysis.

Technology Areas

  • Microelectronics