Analysis of Probe Measurement Accuracies and Scattering Effects
Abstract
The measurement accuracy of electromagnetic (EM) field probes as a function of probe orientation relative to the incident field was investigated. In addition, the mutual coupling effects between EM field probes in close proximity to each other were observed. Far field measurements were performed in an anechoic chamber and compared to predicted values. The results were used to determine the most accurate use of EM field probes for measuring fields inside metal cavities.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1991
- Accession Number
- ADA242672
Entities
People
- Donald W. Metzger
- John D. Norgard
- Ronald M. Sega
Organizations
- Georgia Tech Research Corporation