Particle-Sizing System for Scanning Electron Microscope Images of Solid- Propellant Combustion Exhaust

Abstract

Accurate measurement of particle size distribution of rocket motor exhausts is essential for predicting the combustion efficiency and infrared plume signature. This thesis presents an automated method for extracting particle size distribution from scanning electron microscope (SEM) images. The SEM images were taken off a filter paper placed at the end of a collection probe inserted into the exhaust plume. The automated SEM extraction system consists of n IBM AT-based computer system fitted with a 512 x 480 pixel frame grabber. Photographic images taken off the SEM are acquired via a vidicon camera. A C language program was written to control the hardware and automate the extraction process. A threshold is first applied to the digitized image and the resulting binary image is subjected to object segmentation. Each object is then sized and the distribution from one or more images can be plotted. The main bulk of this thesis document the software specially written to undertake this set of tasks. Results obtained were compared with that from a Malvern MasterSizer particle sizer and found to be favorable. Particles as small as 1/8 microns have been successfully sized.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1991
Accession Number
ADA242700

Entities

People

  • Yeaw-lip Lee

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Materials and Manufacturing Processes
  • Weapons Technologies

DTIC Thesaurus Topics

  • C Programming Language
  • Combustion
  • Combustion Products
  • Computer Programming
  • Computer Programs
  • Computers
  • Electrical Engineering
  • Electron Microscopes
  • Exhaust Plumes
  • Image Processing
  • Image Segmentation
  • Lepidoptera
  • Measurement
  • Particle Size
  • Photographic Images
  • Scanning Electron Microscopes
  • Three Dimensional

Fields of Study

  • Physics

Readers

  • Aerosol Science/Aerosol Physics
  • Image Processing and Computer Vision.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems