An Investigation of Methods for Updating Ionospheric Scintillation Models Using Topside In-Situ Plasma Density Measurements

Abstract

Modern military communication, navigation, and surveillance systems depend on reliable, noise-free transionospheric radio-frequency channels. They can be severely impacted by small-scale electron-density irregularities in the ionosphere, which cause both phase and amplitude scintillation. Basic tools used in planning and mitigation schemes are climatological in nature and thus may greatly over- and under-estimate the effects of scintillation in a given scenario. This report summarizes the results of the first year of a three-year investigation into the methods for updating ionospheric scintillation models using observations of ionospheric plasma-density irregularities measured by DMSP Scintillation Meter (SM) sensor. Results are reported from the analysis of data from a campaign conducted in January 1990 near Tromso, Norway, in which near coincident in-situ plasma-density and transionospheric scintillation measurements were made. Estimates for the level of intensity and phase scintillation on a transionospheric UHF radio link in the early-evening auroral zone were calculated from DMSP SM data and compared to the levels actually observed.

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Document Details

Document Type
Technical Report
Publication Date
May 15, 1991
Accession Number
ADA243378

Entities

People

  • James A. Secan

Organizations

  • Northwest Research Associates

Tags

Communities of Interest

  • Sensors
  • Space

DTIC Thesaurus Topics

  • Artificial Satellites
  • Command And Control
  • Data Analysis
  • Data Sets
  • Electron Density
  • Electrons
  • Geometry
  • High Latitudes
  • Intensity
  • Ion Density
  • Ionosphere
  • Ionospheric Scintillation
  • Latitude
  • Longitude
  • Measurement
  • Meteorological Satellites
  • Observation

Fields of Study

  • Environmental science
  • Physics

Readers

  • Astronomy and Astrophysics.
  • Computational Modeling and Simulation
  • Space/Atmospheric Physics.

Technology Areas

  • Fully Networked C3
  • Fully Networked C3 - Command and Control
  • Microelectronics