Preparation of Ferroelectric Samples for Electrical and Radiation Characterization Studies
Abstract
Procedures have been developed for preparing ferroelectric film samples for electrical and radiation characterization. The procedures discussed herein focus on quick turnaround of samples and the ability to handle a number of different kinds of ferroelectric materials and substrates. New methods of defining the sputtered platinum electrodes and attaching the sample die to suitable packages are also discussed. Techniques have been developed for preparing ferroelectric films for electrical characterization studies and radiation hardness assessments. In recent years, considerable interest has been rekindled in the use of these ferroelectric materials in nonvolatile memory applications. The evaluation of such characteristics as dielectric constant, coercive field, remanent polarization, fatigue , retention, and radiation hardness are especially critical to assessing the use of these materials in nonvolatile memories intended for Army advanced electronics systems. Evaluating many different samples given time is of particular importance, since no single ferroelectric material has not yet emerged as the optimum material for nonvolatile memory applications, and many different material samples must therefore be studied.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1991
- Accession Number
- ADA243432
Entities
People
- Bernard J. Rod
Organizations
- Harry Diamond Laboratories