Critical Temperature Determination in Superconductors

Abstract

This project is based on a program that uses FORTRAN 77 to analyze resistance versus temperature data. The data are fit by two lines with different slopes and intercepts. A total chi-square for the fits is obtained. When the total chi-square is minimized, the critical temperature is assigned to the point where the data are broken into the intersecting two lines. The program also informs the user of the temperature at which those lines intersect. A sensitivity study was performed to find the relationship between uncertainties in the resistance and critical temperature. This analysis showed the resistance needed to be measured with less than 5% error to allow the Tc to be found with an error of three Kelvins. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1991
Accession Number
ADA243537

Entities

People

  • Brian A. Doyle
  • Matthew. G. Mcharg

Organizations

  • United States Air Force Academy

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Chemistry
  • Colorado
  • Computer Programs
  • Copper Oxides
  • Critical Temperature
  • Data Sets
  • Films
  • Procedures (Computers)
  • Resistance
  • Sensitivity
  • Square Roots
  • Superconductors
  • Thin Films
  • Uncertainty
  • United States
  • United States Air Force Academy

Fields of Study

  • Physics

Readers

  • Regression Analysis.
  • Superconducting Magnet Technology
  • Thermal Physics or Thermal Science.