Depth Profiling of Stratified Layers using Variable Angle ATR

Abstract

It is shown that variable angle attenuated total reflectance Fourier transform infrared spectroscopy is a viable technique to recover depth profile information on the molecular level. A number of controlled step profiles are measured to determine the limits of applicability for this method. Results obtained with a germanium and a KRS-5 prism are compared.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1992
Accession Number
ADA245022

Entities

People

  • Hatsuo Ishida
  • Jack L. Koenig
  • Robert A. Shick

Organizations

  • Case Western Reserve University

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Accuracy
  • Angle Of Incidence
  • Evanescent Waves
  • Films
  • Fingerprints
  • Frequency
  • Infrared Spectra
  • Infrared Spectroscopy
  • Materials
  • Military Research
  • New York
  • Polarization
  • Polarizers
  • Polymers
  • Refractive Index
  • Spectra
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Approximation Theory.
  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Computer Vision.