Investigation of Alpha Particle Induced Single-Event Upsets in Charge-Coupled Devices

Abstract

The mechanisms for generation of single-event upsets (SEUs) in a linear charge coupled device (CCD) were studied through irradiation with monoenergetic 5.48 MeV alpha particles from a very low flux Am source. Spatial correlation ( cluster analysis) of soft errors due to single alpha particle hits was demonstrated to be necessary prerequisite for quantitative analysis of different SEU error-generating phenomena. The Texas Instruments TC-103 virtual phase CCD used in this study is shown to be sensitive to alpha particles not only in the vicinity of photosites as expected, but also in the transport CCDS. This latter effect may have adverse consequences for applications employing CCDs as position-sensitive ionizing radiation detectors. The techniques developed in this work for the analysis of one dimensional arrays is readily extensible to two dimensional CCD arrays.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1991
Accession Number
ADA246268

Entities

People

  • Andrew Fechete
  • Gary T. Pepper

Organizations

  • Defence Research and Development Canada

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Acquisition
  • Alpha Particles
  • Charge Coupled Devices
  • Charge Transfer
  • Charged Particles
  • Classification
  • Data Acquisition
  • Detection
  • Detectors
  • Electronics
  • Ionizing Radiation
  • Radioactive Decay
  • Spacecraft
  • Spatial Distribution
  • Two Dimensional
  • X Rays

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Integrated Circuit Design and Technology.
  • Solar Physics