Reflection of X-Rays from Repeated Multilayer Structures

Abstract

A calculation for obtaining the expected reflectivity of soft x-rays from repeated multilayers is described. The calculation is a 'classical' or 'optical' one in the sense that the incoming radiation is described as a plane wave (rather than a collection of photons), and each layer is assumed to be described by a complex index of refraction (not by discrete atoms). A guide to a computer program incorporating this calculation is provided.

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Document Details

Document Type
Technical Report
Publication Date
Feb 11, 1992
Accession Number
ADA246562

Entities

People

  • Dennis B. Brown
  • Herbert B. Rosenstock

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Absorption
  • Computer Programs
  • Computers
  • Diffraction
  • Electromagnetic Fields
  • Electromagnetic Radiation
  • Magnetic Fields
  • Materials
  • Physical Properties
  • Plane Waves
  • Radiation
  • Reflectivity
  • Refraction
  • Refractive Index
  • Soft X Rays
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Regression Analysis.
  • Thin Film Deposition Science.
  • Wave Propagation and Nonlinear Chaotic Dynamics.