High Performance YBCO Films
Abstract
The following progress report describes HTS sample characterization techniques that have been developed during this period for both the high microwave frequency range and for low frequencies below 1 GHz. For the microwave range, the resonator configuration consists of a cylindrical dielectric resonator probe in direct contact with an HTS sample and surrounded by a cylindrical metal (non-HTS) shield. The technique will be used for rhe nondestructive testing of HTS films on dielectric substrates with very large areas. Furthermore, it probes the quality of the HTS thin film over a small selective area with high resolution of the surface resistance. It has the ability to measure surface resistance at least an order of magnitude better than gold at millimeter wave frequencies. Our current set up is suitable for substrate diameters up to 5 cm limited by the size of the cryogenic cooler. For characterization at low frequencies below 1 GHz, we have designed and built self-resonant spirals patterned on HTS samples that require very little substrate area.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 31, 1992
- Accession Number
- ADA246802
Entities
People
- Edgar J. Denlinger
Organizations
- Sarnoff Corporation