Studies of 1,3-Disilacyclobutanes as Single-Source CVD Precursors to Silicon Carbide

Abstract

Substituted 1,3-disilacyclobutanes were studied as potential low temperature single-source CVD precursors to silicon carbide. These studies were carried out in a cold-wall LPCVD system maintained at a total reactor pressure of 1.0 Torr using a mass flow controlled argon carrier gas. The precursor was decomposed on resistively heated Si(100) substrates at temperatures ranging from 700 C - 1100 C. Gas chromatography-Fourier transform infrared spectroscopy and quadrupole mass spectrometry were used to identify the volatile pyrolysis byproducts from each precursor. The decomposition onset temperature was separately determined for each precursor by monitoring the major pyrolysis byproducts, by using quadrupole mass spectrometry, while slowly increasing the substrate temperature. Scanning and transmission electron microscopy were used to determine the crosssectional and surface morphology and also the deposition rate, which ranged from ca.0.035 micron/h to 12.0 micron/h. Silicon carbide, Disilacyclobutanes, MOCVD, single-source precursor.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1991
Accession Number
ADA247111

Entities

People

  • David J. Larkin
  • Leonard V. Interrante

Organizations

  • Rensselaer Polytechnic Institute

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Availability
  • Ceramic Materials
  • Chemical Vapor Deposition
  • Chemistry
  • Compound Semiconductors
  • Decomposition
  • Electron Microscopy
  • Elements
  • Films
  • Gas Chromatography
  • Infrared Spectroscopy
  • Mass Spectrometry
  • Military Research
  • Silicon Carbide
  • Spectrometry
  • Spectroscopy
  • Surface Temperature

Readers

  • Organic Chemistry
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene