Surface Reconstruction and Templating for Zeolite Thin Film Synthesis Observed by Atomic Force Microscopy

Abstract

Atomic force microscopy (AFM) allows one to nondestructively image insulating surfaces in air or under liquids with molecular resolution. When applied to zeolites this technique allows observation of real time processes of crystal structure on the external surface of a single crystal under water, salt solutions or alcohols. It also offers the opportunity to directly observe surface reconstruction using solution cationic templates to generate new zeolitic thin film phases. In this study, AFM was used to monitor room temperature lattice reconstruction on the surface of a natural single crystal of stilbite using sodium ion templates to form a new periodic lattice. This is the first reported application of AFM for the investigation of reconstructive chemistry of a nonconducting surface.

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Document Details

Document Type
Technical Report
Publication Date
May 15, 1992
Accession Number
ADA251140

Entities

People

  • A. L. Weisenhorn
  • Galen D. Stucky
  • J. E. Macdougall
  • Paul K. Hansma

Organizations

  • University of California, Santa Barbara

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Chemical Synthesis
  • Chemistry
  • Crystal Structure
  • Crystals
  • Films
  • Manufacturing
  • Materials
  • Materials Science
  • Microscopy
  • Military Research
  • Silicates
  • Single Crystals
  • Solid State Physics
  • Tectosilicates
  • Thin Films
  • X Rays
  • X-Ray Diffraction

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene