AFM Study of Film Growth Kinetics in Heteroepitaxy

Abstract

The growth of CuCl/CaF2 heterostructures has been studied with an atomic force microscope (AFM). We have grown by molecular beam epitaxy (MBE) CuCl thin films at various substrate temperatures and thicknesses on CaF2(111) substrates. AFM studies reveal that islanding is the dominant growth mechanism. We calculated the height-height correlation function,/Ih(q,t)12>, for each of our films and compared them to the predictions made by the Shadowing Growth Theory, a preexisting growth model that enabled us to extract the important kinetic parameter of surface diffusion length for the growth condition of each of the four films.

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Document Details

Document Type
Technical Report
Publication Date
Apr 28, 1992
Accession Number
ADA252408

Entities

People

  • A. Yanase
  • E. J. Snyder
  • R. Stanley Williams
  • W. M. Tong
  • Y. Segawa

Organizations

  • University of California, Los Angeles

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • California
  • Chemistry
  • Crystal Oscillators
  • Diffusion
  • Energy
  • Epitaxial Growth
  • Equations
  • Films
  • Jet Propulsion
  • Kinetics
  • Materials
  • Materials Science
  • Military Research
  • Optical Properties
  • Physics
  • Substrates
  • Thin Films

Fields of Study

  • Materials science

Readers

  • Materials Science (Mechanical Engineering).
  • Thin Film Deposition Science.