Use of an Optical Multichannel Analyzer for Reflectivity Measurements
Abstract
Current theories that attempt to explain the emission and reflection properties of metallic surfaces still provide some room for conjecture and alternative concepts. This is true particularly for processes in the visible portion of the electromagnetic spectrum. One relatively new theory that has recently received increased attention and support is that of the 'native cluster' model. the model proposes that metallic surfaces are populated with small groups of atoms that have been liberated from the crystalline lattice structure of the bulk metal. These colloids possess dielectric qualities that act to modify basic properties of the parent material, such as polarizability, electrical conductivity, thermal emission, and luminescence. While proof of luminescence from metallic surfaces would not significantly detract from existing free electron and quantum theory, it would tend to support the 'native cluster' model. Due to its reflectivity characterisitics, copper was selected as the metal to be studied in this research. One instrument that is well suited for the collection of reflectivity and emission data is the Optical Multichannel Analyzer. Although a powerful tool for spectral research, the requirement of a significant initial investment of time necessary to gain sufficient user familiarity to become proficient with the equipment has resulted in the instrument being underutilized. Therefore, in addition to the primary aim of this research in evaluating the ability of a polished copper surface to luminesce, a secondary aim was to evaluate the characteristics and applicability of this instrument to support the luminescence research.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1992
- Accession Number
- ADA252932
Entities
People
- David T. Moroney
Organizations
- Naval Postgraduate School