Multichip Module High Speed Testing
Abstract
May 1992 Research had continued on the characterization of polymers for high speed interconnection circuits in multi-chip modules. As an extension of our previous work on electro-optic response and sensitivity of poled side chain polymers, we have developed a new interferometric technique for measurements of the dielectric constant and loss over a frequency range from 10 GHz to over 3 THz. The method we used is an extension of the recently developed terahertz spectroscopy. It consists of the generation of a very short electrical pulse into free space, which is then transmitted through the polymer sample, passed through a Fourier transform interferometer, and detected in a bolometer. The source of short electrical pulses used is a p-i-n diode illuminated by a femtosecond optical pulse. We have previously shown that this technique is a very effective method of generating sub-picosecond electrical pulses in free space.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1992
- Accession Number
- ADA253364
Entities
People
- David H. Auston
Organizations
- Columbia University