Multichip Module High Speed Testing
Abstract
Research continues on characterization of electro-optic polymers for high speed transmission lines. The poled polymer material we used for this application is a copolymer of methylmethacrylate (MMA) and methacrylate-bound dispersive red 1 dye (MA 1). Our previous measurements have shown that this material has several desirable features. First, it has a very large bandwidth. We have measured an electrical transient as short as 760 fs which is only limited by the device parasitic effects. The intrinsic response of the polymer should be much faster. Secondly, it has a relatively large electro-optic coefficient comparable to that of LiTaO3. Thirdly, this material has a small dielectric constant which makes it favorable for integration into the high speed devices. We have integrated this polymer material into a photoconductive switch- transmission line, and used the electro-optic property of the polymer to characterize the dispersion of the transmission line. This approach has potentially important applications for the characterization of high speed interconnection lines in multi-chip modules. A femtosecond laser beam is focused down on the biased photoconductive gap to induce an electrical transient which propagates along the transmission line. To measure this transient, we use an electro-optic sampling technique. The polymer is fabricated on the top of the transmission line as electro-optic material. By measuring the shape of the transient at different distances on the transmission line, we can obtain the dispersion properties of the transmission line.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1992
- Accession Number
- ADA254331
Entities
People
- David H. Auston
Organizations
- Columbia University