Theoretical Development for Depth Profiling of Stratified Layers Using Variable Angle ATR

Abstract

The theory allowing depth profile information to be recovered from variable angle attenuated total reflection spectroscopy is shown for both perpendicular and parallel polarizations. The errors invoked by the necessary approximations are evaluated by comparison with exact optical simulations using dispersion theory.

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Document Details

Document Type
Technical Report
Publication Date
Sep 11, 1992
Accession Number
ADA255571

Entities

People

  • Hatsuo Ishida
  • Jack L. Koenig
  • Robert A. Shick

Organizations

  • Case Western Reserve University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Angle Of Incidence
  • Dielectric Permittivity
  • Dielectrics
  • Equations
  • Films
  • Frequency
  • Materials
  • Military Research
  • New York
  • Numbers
  • Optical Properties
  • Optics
  • Radiation
  • Reflection
  • Refractive Index
  • Thin Films
  • United States

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Oceanography.
  • Spectroscopy.