A Preliminary Examination of "Y1" (a Proprietary Thin-Film Ferroelectric Produced by Symetrix Corporation)

Abstract

This report presents the results of several tests of the ferroelectric thin film, designated Y1 thin films, which was developed by Symetrix Corporation. The tests include fatigue, at room temperature and 125 deg C, to greater than 2 x 10 to the 11th power cycles; retention for short periods of time (up to 1000 s) at room temperature and 125 deg C; retention after fatigue; voltage dependence of retained polarization from 1.5 to 8 V; and write pulse-width dependence of retained polarization from 50 ns to 500 ms. While these tests address critical issues for nonvolatile memory applications, they were limited by a time constraint of one week, and more testing is needed.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1992
Accession Number
ADA255692

Entities

People

  • James M. Mcgarrity
  • Joseph M. Benedetto
  • Judith T. Mccullen
  • Randall A. Moore

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitors
  • Corporations
  • Fatigue Tests (Mechanics)
  • Films
  • High Temperature
  • Ionizing Radiation
  • Materials
  • Nonvolatile Memories
  • Packaging
  • Polarity
  • Polarization
  • Radiation
  • Standards
  • Test And Evaluation
  • Thin Films
  • X Rays

Readers

  • Materials Science and Engineering.
  • Organic Chemistry
  • Systems Analysis and Design