Characterization of Cholesteric Cyclic Siloxane Liquid Crystalline Materials
Abstract
The preliminary investigation of a new type of a liquid crystalline material is described. These cyclic cholesteric siloxanes exhibit selective reflection which can be varied from the UV to the NIR by changing composition. DSC, TGA, SEK, TEM, UV-VIS-NIR spectroscopy, and polarized optical microscopy (POM) were used to obtain preliminary information on the thermal, optical and macroscopic packing behavior as it related to possible optical applications of these materials. Considerable effort was also employed in examining the wide- angle and small-angle X-ray scattering (WAXS and SAXS) patterns obtained from these materials in a variety of forms including film, fiber, and powder samples. Liquid Crystal, X-Ray Diffraction, Cholesteric, Electron Microscopy, Siloxane Smectic, Spectroscopy.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1991
- Accession Number
- ADA256128
Entities
People
- Edward T. Samulski
- Herbert E. Klei
- R. L. Crane
- Timothy J. Bunning
- W. W. Adams
Organizations
- Wright Laboratory