Processing and Characterization of Electrophoretically Deposited Holmium Barium Copper Oxide Superconductor Films

Abstract

Thick films of HoBa2Cu3O7-x (HBCO) were electrophoretically deposited on bulk YBa2Cu3O7-x (YBCO) pellets in magnetic fields of 0 and 2 T. X-ray diffraction patterns indicated no preferred orientation for the films. Scanning electron microscopy revealed that the films averaged 7 microns thick, have an open pore structure with microbridges between particles, and a minimal amount of grain growth. Some microcracking of the films was observed. The surface resistivities (Rs) of the films were measured from 5 to 140K using a resonant cavity at 35 GHz. The best films had a Rs of 30 milliohms at 10K. The transition temperature (Tc) of the films ranged from 85 to 90K as measured by the four- point probe method.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1992
Accession Number
ADA256329

Entities

People

  • Donald W. Eckart
  • Ernest Potenziani Ii
  • Michelle A. Dornath-mohr
  • Robert D. Finnegan
  • William Wilber

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Copper
  • Copper Oxides
  • Electrical Properties
  • Electron Microscopes
  • Electron Microscopy
  • Electrophoretic Deposition
  • Films
  • Grain Growth
  • Magnetic Fields
  • Materials
  • Microscopy
  • Particles
  • Scanning Electron Microscopy
  • Superconductors
  • Thick Films
  • X Rays
  • X-Ray Diffraction

Readers

  • Materials Science and Engineering.
  • Mathematics or Statistics
  • Superconducting Magnet Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene