Microstack Insulator for Flashover Inhibition. Phase 2

Abstract

The program achieved results that represent a breakthrough in vacuum surface flashover insulation. The samples designed as the optimum configuration failed through the dielectric bulk before surface flashover was observed. In fact the ultimate limitation is the vacuum breakdown of the anode-cathode electrode system. As shown later we determine that for 100-nsec-long pulses the vacuum breakdown voltage of the electrode system was above 350 kV/cm, with some pulses as high as 450 kv/cm. Typical microstacks will sustain voltages above 280 kv/cm, with optimized samples failing typically at average fields above 400 kv/cm and not because of surface flashover but through the bulk of the sample. These numbers are excellent considering that the fitted data corresponds to 1 failure out of 15 pulses. The scaling equation from J. C. Martin is used for a 50% probability of failure. The scaling equation produced by the microstack insulator comes from better than 10% (6.6%) probability of failure, or 94% reliability at the calculated voltage. Insulator, Flashover, Breakdown. Vacuum, Surface,

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1992
Accession Number
ADA256338

Entities

People

  • Juan M. Elizondo
  • William M. Moeny

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Charge Density
  • Dielectric Permittivity
  • Dielectrics
  • Electric Fields
  • Electromagnetic Fields
  • Electron Emission
  • Emission
  • Energy
  • Equations
  • Fabrication
  • High Pressure
  • Insulation
  • Polarity
  • Secondary Emission
  • Trajectories
  • Vacuum Apparatus
  • Vacuum Chambers

Fields of Study

  • Engineering
  • Physics

Readers

  • Electrical Engineering
  • Regression Analysis.

Technology Areas

  • Microelectronics