Characterization of Spheres With The Submicron Particle Analyzer: Feasibility
Abstract
A method is described for inverting light scattering data to find the size parameter (x) and refractive index (n) of small dielectric spheres. The data considered is restricted to that obtainable with the U.S. Army Chemical Research, Development and Engineering Center's Submicron Particle Analyzer (i.e. , ratios of intensities detected at a number of fixed directions about the scattering sphere). The inversion process works by comparing measured flux ratios with the same ratios previously calculated over a range of x,n values, and finding those x,n pairs for which measured and calculated ratios are consistently in agreement, to within the experimental uncertainty. Using numerical simulations of measurements and estimating the experimental error to be +/- 10%, we find that about 13 ratio measurements are needed to perform satisfactory inversions.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1992
- Accession Number
- ADA258069
Entities
People
- Jerold R. Bottiger
Organizations
- Edgewood Chemical Biological Center