Multichip Module High Speed Testing

Abstract

Work is proceeding on the testing of high-speed circuits using poled electrooptic polymers. Coplanar electrodes with thin layer (3 microns) coatings of a copolymer system. The samples were poled at their glass transition temperature of 132 deg C at a poling field of 0.50 MV/cm. The response was measured in transmission mode through the electrode gap using a Ti:sapphire laser and a lock-in amplifier.

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Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1992
Accession Number
ADA261391

Entities

People

  • David H. Auston
  • Robert J. Davis

Organizations

  • Columbia University

Tags

DTIC Thesaurus Topics

  • Alkenes
  • Amplifiers
  • Beam Splitting
  • Detection
  • Detectors
  • Electrodes
  • Frequency
  • Glass Transition Temperature
  • Laser Diodes
  • Lasers
  • Measurement
  • Metal-Semiconductor Junctions
  • Multichip Modules
  • Polymers
  • Transition Temperature
  • Transmission Lines

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Materials Science and Engineering.
  • Optical Physics and Photonics.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene