Accurate Determination of Auger Line Shape Binding Energies.

Abstract

A quantitative comparison between an experimental and a theoretical description of any Auger spectrum requires a common energy reference point such as the Fermi level. With non-conductors this is problematic, since the Fermi level is not well defined and charging may shift the Fermi level. A common approach to overcome this problem employs spectra containing the Auger peak, core, and valence band (VB) photoemission peaks. One then has only to locate a common reference point in the Auger and VB spectra relative to the core level peak. We have developed a procedure where a comparison is made between model theoretical and experimental spectra so that a large energy range (about 20 eV) of each spectrum can be utilized to locate the common reference points. We have found that this method enables accurate reference points to be determined even with severe sample charging. The method is precise enough to observe what may be a differential charging effect in the polyethylene (PE) spectra. This suggests that the photoelectron and Auger peaks may not shift an equal amount with charging in all instance. Although much smaller than that previously reported, a breakdown in the Cini-Sawatzky expression as modified for covalent systems still is suggested for PE.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1993
Accession Number
ADA261803

Entities

People

  • David E. Ramaker
  • F. L. Hutson
  • N. H. Turner

Organizations

  • George Washington University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Chemistry
  • Dielectric Polymers
  • Electronic Structure Theory
  • Energy Bands
  • Fermi Levels
  • Molecular Orbital Theory
  • Photoelectric Emission
  • Photoelectrons
  • Physical Chemistry
  • Plastic Explosives
  • Quantum Chemistry
  • Spectra
  • Valence
  • Valence Bands
  • Valence Bond Theory

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics