Random-Like Interconnects, Fault Tolerance and Grain-Size Studies for Optoelectronic Computing

Abstract

Our objective during the funding period, July 1, 1989 to September 15, 1992, was to investigate random like interconnects, fault tolerance, and grain size studies for optoelectronic parallel processors. The major focus has been in the design and analysis of parallel optoelectronic interconnection networks. Two major areas were identified and researched. The first involves the design, analysis, and simulation of perfect shuffle-based optoelectronic multistage interconnection interconnection networks(MINs) for highly parallel computers. The objective was first to perform a quantitative performance comparison-between optoelectronic and VLSI implementations of multistage interconnection networks (MINs). The next task was to optimize the optoelectronic MIN with respect to architectural and technological parameters. The final goal was to design and simulate a MIN system that could provide a complete set of communication and synchronization services.

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Document Details

Document Type
Technical Report
Publication Date
Sep 15, 1992
Accession Number
ADA262360

Entities

People

  • R. Paturi
  • S. C. Esener
  • Sang‐Hyun Lee

Organizations

  • University of California, San Diego

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Algorithms
  • California
  • Computers
  • Computing System Architectures
  • Detectors
  • Distributed Computing
  • Energy Consumption
  • Fault Tolerance
  • Grain Size
  • Holographic Optical Elements
  • Lepidoptera
  • Logic
  • Network Architecture
  • Optical Interconnects
  • Optoelectronic Devices
  • Parallel Processors
  • Simulations

Readers

  • Integrated Circuit Design and Technology.
  • Parallel and Distributed Computing.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics