Uniaxial Compressive Response of M26A1E1 as a Function of Temperature

Abstract

A joint Hercules-Olin M14 Replacement Program for the M865 round considered M26A1E1 gun propellant as a candidate replacement for the current M14 gun propellant. This report outlines the results of uniaxial compression tests on M26A1E1 propellant as a function of temperature, -40, -20, 20 and 50 degrees Celsius and constant strain rate, 100 sec I/s. The mechanical behavior of M26A1E1 is quantified using various mechanical response parameters such as yield stress, yield strain, compressive modulus, failure modulus, and absorbed energy density. In general, the mechanical behavior of M26A1E1 is more sensitive to temperature than M14. However, M26A1E1 is less susceptible to fracture damage than M14 over the temperature range -40 to 50 degrees Celsius. Scanning electron microscopy (SEM) of 'cold-fractured' surfaces of M26A1E1 reveal the presence of undissolved nitrocellulose (NC) fibers on the order of 20-58 micrometers. Some NC fibers 'pull-out' during the cold-fracture process and leave behind a depression in the propellant surface. The surface of the depression reacts with the electron beam at high magnification forming blisters and extensional cracks.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1993
Accession Number
ADA262365

Entities

People

  • George A. Gazonas
  • Michael G. Leadore

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Artillery
  • Compression
  • Depression
  • Double Base Propellants
  • Electron Beams
  • Energetic Materials
  • Explosives
  • Gun Propellants
  • Jet Propulsion
  • Materials
  • Materials Laboratories
  • Mechanical Engineering
  • Mechanical Properties
  • Mechanics
  • Military Research
  • Propellants
  • Strain Rate

Fields of Study

  • Physics

Readers

  • Powder metallurgy of Titanium alloys.
  • Rocket Propulsion.
  • Structural Dynamics.

Technology Areas

  • Directed Energy
  • Microelectronics