Multichip Module High Speed Testing

Abstract

Progress in the testing of multichip module electronic circuit packages for the period Jan. 1, 1993 - Mar. 31, 1993 is described below, in the areas of the testing of multichip modules using electrooptic polymers and organic crystals.

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Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1993
Accession Number
ADA262989

Entities

People

  • David H. Auston
  • Robert J. Davis

Organizations

  • Columbia University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Electrodes
  • Electronic Circuits
  • Electronics
  • Frequency Response
  • Glass Transition Temperature
  • Helium Neon Lasers
  • Laser Diodes
  • Lasers
  • Materials
  • Multichip Modules
  • Photodetectors
  • Polymers
  • Repetition Rate
  • Test Methods
  • Transition Temperature
  • Voltage Amplifiers

Readers

  • Data Mining and Knowledge Discovery.
  • Materials Science and Engineering.
  • Software Engineering

Technology Areas

  • Microelectronics