Spatial Light Modulators (SLMs) Surface Quality
Abstract
The phase modulating properties of spatial light modulators (SLMs) have been investigated for optical pattern recognition purposes for many years. An interferometric microscope was recently utilized to investigate the surface uniformity, and thus phase distortion, of several SLMs that are commercially available. These interferometric results are presented here and verify that the optical uniformity of SLMs should be considered when phase modulating properties of the devices are to be applied in optical systems.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1993
- Accession Number
- ADA263249
Entities
People
- Tracy D. Hudson
Organizations
- United States Army Aviation and Missile Command