Final Progress Report for Contract N00014-91-J-1785 (University of North Texas, Denton. Department of Physics),
Abstract
An accelerator mass spectrometry (AMS) facility has been developed at the Ion Beam Modification and Analysis Laboratory (IBMAL) at the University of North Texas (UNT) in conjunction with the 3 MV Tandem Accelerator. The computer controlled AMS instrument allows automatic mass scans of stable isotopes in solid materials using a new ultra-clean, low sample contamination ion source. The AMS instrument allows molecular interference-free mass scans to be obtained with a higher sensitivity than Secondary Ion Mass Spectrometry (SIMS) for many elements. The new low sample contamination, microbeam, raster-scanning, depth-profiling ion source recently completed should allow sensitivities of ppt (1 part in 10(exp 12) or 10(exp 10) atoms/cu cm) for almost any element in the periodic table as well as secondary electron imaging of a sample. Raster scanning and depth profiling capabilities are available. These should be ready for routine use by the third quarter of 1993. Microbeam capabilities should be available by the third quarter of 1993.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 18, 1993
- Accession Number
- ADA263942
Entities
People
- Floyd D. Mcdaniel
Organizations
- University of North Texas