Test Structure to Microcircuit Correlation

Abstract

This Parametric Analysis of Radiation effects software development is given the general title PARA. This report describes the development of algorithms and source codes for the simulation of radiation effects on CMOS ICs. The project concentrated on the simulation of total dose effects and the ways to establish/predict the operational lifetime and radiation tolerance of ICs. The PARA switch level simulator incorporates the capability to assign bias dependent postirradiation drive parameters to transistors within a microcircuit and to calculate propagation delays based on those parameters. This permits test vectors to be assigned based on worst case postirradiation propagation delays... . Radiation effects software, IC Radiation operating performance prediction, IC Failure mode identification, Switch-level simulation algorithms.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1993
Accession Number
ADA264157

Entities

People

  • Edward W. Enlow

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Capacitance
  • Corporations
  • Electronics
  • Engineering
  • Failure Mode And Effect Analysis
  • Governments
  • Ionizing Radiation
  • Measurement
  • Microcircuits
  • Power Supplies
  • Radiation
  • Resistance
  • Simulations
  • Specifications
  • Transmission Lines
  • United States

Fields of Study

  • Engineering
  • Physics

Readers

  • Computational Modeling and Simulation
  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics