Atomic-Scale Imaging of Surfaces and Interfaces. Materials Research Society Symposium Proceedings Held in Boston, Massachusetts on November 30-December 2, 1992. Volume 295
Abstract
The gap between imagining and imaging is getting ever smaller. Atomic-Scale Imaging of Surfaces and Interfaces, Symposium W at the 1992 MRS fall Meeting in Boston, Massachusetts, brought together researchers using most state-of-the-art imaging techniques capable of resolving atomic features. Methods represented were scanning tunneling microscopy (STM), atomic force microscopy (AFM), low energy electron microscopy (LEEM), transmission (TEM) and reflection (REM) electron microscopy, scanning electron microscopy (SEM), atom probe field ion microscopy (APFIM or POSAP), high and low energy external source electron holographies and internal source electron holographies. Some highlights from the STM papers included discussions of the limitations and future potential of STM as well as current findings. Several papers presented work with STM at elevated temperatures. Jene Golovchenko reviewed STM work showing cooperative diffusion events (Pb on Ge) involving many tens of substrate atoms. Don Eigler focused on atomic manipulation and some of its uses to enable fundamental studies of small atomic clusters.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1992
- Accession Number
- ADA265674
Entities
People
- David J Smith
- David K. Biegelsen
- S. Y. Tong
Organizations
- Materials Research Society