Stress Sensitivity of Dielectric Resonators
Abstract
The objective of research is to investigate the sensitivity of the frequency-shifts of the guided EM waves in dielectric resonators when they are subjected to external forces, shocks, or vibrations. Forces applied to a resonator produce stresses which, through the nonlinear piezooptical effect, changes the permittivity constant into an inhomogeneous, second-order permittivity tensor, depending upon the spatial distribution of stresses. This changing in material property, in turn, affects the velocities and couplings of EM waves inside the resonator and hence causes the shifts of resonances. Closed form solutions of the 3-D Maxwell's equations for finite resonators are very few and they are known only for solid sphere and torus of homogeneous isotropic dielectrics. In order to study the problems of stress effect on the vibrations in dielectric plate resonators, circular or rectangular, in a systematic way, the research is conducted according to the following sequence. A system of 2-D equations for guided waves is deduced from the 3-D Maxwell's equations. Closed form solutions are obtained from these 2-D equations for circular disks embedded in free space. Then the stress sensitivity of guided waves in circular isotropic disks and in infinite anisotropic plates are studied.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 14, 1993
- Accession Number
- ADA266767
Entities
People
- Peter C. Lee
Organizations
- Princeton University