A Method for Estimating Scene Parameters from Color Histograms,

Abstract

One of the key tools in applying physics-based models to machine vision has been the analysis of color histograms. In the mid-1980s, it was recognized that the color histogram for a single inhomogeneous surface with highlights will have a planar distribution in color space. It has since been shown that the colors do not fall randomly in a plane, but form clusters at specific points. Physics-based models of reflection predict that the shape of the histogram is related not only to the illumination color and object color, but also to such non-color properties as surface roughness and imaging geometry. We present here an algorithm for analyzing color histograms that yields estimates of surface roughness, phase angle between the camera and light source, and illumination intensity. These three scene parameters are related to three histogram measurements. However the relationship is complex and cannot be solved analytically. Therefore we have developed a method for estimating these properties by interpolating between histograms that come from images of known scene properties. We present tests of our algorithm on simulated data and the results compare well with the known simulation parameters. We also test our method on real images and the results compare favorably with the actual parameters estimated by other means. Our method for estimating scene properties is very fast, and requires only a single color image.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1993
Accession Number
ADA269013

Entities

People

  • Carol L. Novak
  • Steven Arthur Shafer

Organizations

  • Carnegie Mellon University

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • C4I

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Brightness
  • Computer Science
  • Computer Vision
  • Dielectrics
  • Geometry
  • Illumination
  • Light Sources
  • Materials
  • Measurement
  • Object Recognition
  • Refraction
  • Refractive Index
  • Scattering
  • Simulations
  • Surface Roughness

Fields of Study

  • Computer science
  • Physics

Readers

  • Computational Modeling and Simulation
  • Computer Vision.

Technology Areas

  • Space